Ion Beam Analysis Methods for Materials Analysis and Sample Screening

Apr
19

Ion Beam Analysis Methods for Materials Analysis and Sample Screening

Professor Graham Peaslee, Physics, University of Notre Dame

11:00 a.m.–12:00 p.m., April 19, 2022   |   Carey Auditorium, 107 Hesburgh Library

The use of standard Ion Beam Analysis techniques in an applied environmental science role will be presented. This includes using Particle-Induced X-ray Emission (PIXE) to study the fate and transport of flame retardants and heavy metals from consumer products into our environment.  Recent studies focus on an emerging class of chemicals of concern (Per- and Polyfluorinated Alkyl Substances) that are ubiquitous in in our textiles, food packaging, personal care products and industrial uses. These chemicals can be measured by Particle-Induced Gamma-ray Emission (PIGE) and the most significant of these findings have already had a significant effect on science policy surrounding their use in the United States.  The adaptation of these techniques to run ex vacuo allows for the rapid analysis of many samples which expands the utility of this technique into many different types of materials. The interplay between this applied physics research and the science policy landscape will be discussed as well.

Graham Peaslee
Graham Peaslee

Graham Peaslee is a professor of physics at the University of Notre Dame.  He leads an active research group in the area of applied nuclear science where he brings established nuclear measurement techniques to pressing environmental issues. His interests include the detection of total fluorine as a surrogate for PFAS (per- and polyfluorinated alkyl substances), but also rapid screening of materials for heavy metals and other chemicals of concern.  He earned a bachelor’s degree in Chemistry from Princeton University and a Ph.D. in Chemical Physics from the State University of New York in Stony Brook, NY.